Micro electromechanical systems, or MEMS, aren’t anything new. But Purdue University’s Jason Vaughn Clark has ideas which are far grander than those we’ve seen already. Mr. Clark has purportedly developed a new take on an old spin, with electro micro metrology (EMM) enabling engineers to ” account for process variations by determining the specific movement and force that’s being applied to, or sensed by, a MEMS device.” These self-calibrating machines are the first to accomplish that without any external references, which would allow nanotechnologists, crime forensics researchers and an entire host of others to work out what actually happens at a microscopic level. In theory, the gurus working on these things long to improve the accuracy of atomic force microscopes and to eventually create a diminutive AFM-on-a-chip, which — in line with Clark — could ” open the door to the nanoworld to a far larger number of groups or individuals.” We’re waiting.
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